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A
microscope that uses a tiny probe mounted on a cantilever to scan the surface of an object. The
probe is extremely close to-but does not touch-the surface. As the probe
traverses the surface, attractive and repulsive forces arising between it and
the atoms on the surface induce forces on the probe that
bend the cantilever. The amount of bending is measured and
recorded, providing a map of the atoms on
the surface. Atomic force microscopes can achieve magnification of a factor
of 5 × 106, with a resolution of 2 angstroms,
sufficient to resolve individual carbon
atoms. Also called scanning force microscope.
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The
atomic force microscope (AFM) or scanning force microscope (SFM) is a very
high-resolution type of scanning probe microscope,
with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling
microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early
1980s, a development that earned them the Nobel Prize for
Physics in 1986. Binnig, Quate and Gerber invented the first AFM in 1986. The
AFM is one of the foremost tools for imaging, measuring and manipulating
matter at the nanoscale.
The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny
but accurate and precise movements on (electronic)
command enable the very precise scanning.
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The
atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope. The
AFM was invented by Binnig, Quate and Gerber in 1986, and is one of the
foremost tools for imaging, measuring and manipulating matter at the nanoscale.
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Atomic
force microscopy (AFM) is a technique for analyzing the surface of a rigid
material all the way down to the level of the atom .
AFM uses a mechanical
probe to magnify surface features up to 100,000,000 times, and it produces
3-D images of the surface.
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An
instrument able to image surfaces to molecular
accuracy by mechanically probing their surface contours. A kind of proximity
probe
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(engineering) A device for mapping surface atomic
structure by measuring the force acting on the tip of a sharply pointed wire
or other object that is moved over the surface.
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Technique
for imaging surfaces by mechanically scanning their surface contours using a
microfabricated probe, in which the deflection of a sharp tip sensing the
surface forces, mounted on a soft cantilever, is monitored as the tip is moved
across the surface
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Is
the van der Waals force between the tip
and the surface; this may be either the short range repulsive force (in
contact-mode) or the longer range attractive force (in non-contact mode).
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A
scanning probe microscopy
instrument capable of revealing the structure of samples. The AFM uses a
sharp metal tip positioned over a conducting or non-conducting substrate and the surface topography is mapped out
by measuring the mechanical
force exerted on the tip. See scanning probe microscopy.
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An
atomic force microscope.
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A
device in which the deflection of a sharp stylus mounted on a soft spring is
monitored as the stylus is moved across a surface. If the deflection is kept
constant by moving the surface up and down by measured increments, the result
(under favorable conditions) is an atomic-resolution topographic map of the surface. Also
termed a scanning force microscope.
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An
instrument able to image surfaces to molecular
accuracy by mechanically probing their surface contours. A kind of proximal
probe.
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Atomic
force microscopy is a technique for analysing the surface of a rigid material
all the way down to the level of the atom.
AFM uses a mechanical
probe to magnify surface features up to 100 000 000 times, and produces 3D
images of the surface. The technique is derived from a related technology, called scanning tunnelling microscopy
(STM). The difference is that AFM does not require the sample to conduct
electricity, whereas STM does. AFM also works in
regular room temperatures,
while STM requires special temperature
and other conditions. AFM is being used to understand materials problems in
many areas including data storage, telecommunications, biomedicine,
chemistry,
and aerospace. The atomic force microscope was invented in 1986. It uses
various forces that occur when two objects are brought within nanometres of each other. An AFM can work either when the probe is in contact with a
surface, causing a repulsive force, or when it is a few nanometres away, where the force is attractive.
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Atomic
force microscopy (AFM) is a technique for analyzing the surface topography
with a resolution down to the level of the atom. The AFM detects forces acting on a probe which is
in mechanical
contact with the surface using a small spring or cantilever. The probe is scanned line by line
over the area of interest, whereby the topography is derived from the bending
or deflection of the cantilever. The AFM is closely related to another
scanning probe technique (SPM), called scanning tunneling
microscopy (STM). The difference is that AFM does not require a conductive
sample, whereas STM does. AFM is being used to understand materials problems
in many areas, including data storage, telecommunications, biomedicine,
chemistry,
and aerospace.
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An
instrument able to image surfaces to molecular
accuracy by mechanically probing their surface contours. A kind of proximity
probe.
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An
instrument able to image surfaces to molecular
accuracy by mechanically probing their surface contours. A kind of proximal
probe. .... A device in which the deflection of a sharp stylus mounted on a soft
spring is monitored as the stylus is moved across a surface. If the
deflection is kept constant by moving the surface up and down by measured
increments, the result (under favorable conditions) is an atomic-resolution topographic map of the surface. Also
termed a scanning force microscope. [FS] See How AFM Works, What is an Atomic Force Microscope? And Window
on a Small World
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An
instrument able to image surfaces to molecular
accuracy by mechanically probing their surface contours. Measuring the atomic
force acting on its tip as it moves along the surface of the sample.
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Atomic
force microscopy is a technique for analysing the surface of a rigid material
all the way down to the level of the atom.
AFM uses a mechanical
probe to magnify surface features up to 100 000 000 times, and produces 3D
images of the surface. The technique is derived from a related technology, called scanning tunnelling microscopy
(STM). The difference is that AFM does not require the sample to conduct
electricity, whereas STM does. AFM also works in
regular room temperatures,
while STM requires special temperature
and other conditions. AFM is being used to understand materials problems in
many areas including data storage, telecommunications, biomedicine,
chemistry,
and aerospace. The atomic force microscope was invented in 1986. It uses
various forces that occur when two objects are brought within nanometres of each other. An AFM can work either when the probe is in contact with a
surface, causing a repulsive force, or when it is a few nanometres away, where the force is attractive.
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An
instrument able to image surfaces to molecular
accuracy by mechanically probing their surface contours. A kind of proximal
probe. .... A device in which the deflection of a sharp stylus mounted on a
soft spring is monitored as the stylus is moved across a surface. If the
deflection is kept constant by moving the surface up and down by measured
increments, the result (under favorable conditions) is an atomic-resolution topographic map of the surface. Also
termed a scanning force microscope. [FS] See How AFM Works, What is an Atomic Force Microscope? And Window
on a Small World
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A
type of scanning probe microscopy that
maps the topography of an interface
by scanning a force sensor over the interface.
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