Instrumentation used to observe minute surface details of small organisms/objects at high magnification by means of electron lenses. SEM techniques are often employed and needed to correctly identify a dinoflagellate species.

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The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition and other properties such as electrical conductivity.

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The scanning electron microscope (SEM) is a type of electron microscope capable of producing high resolution images of a sample surface. Due to the manner in which the image is created, SEM images have a characteristic 3-dimensional quality and are useful for judging the surface structure of the sample.

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Any of a class of microscopes that use electrons rather than visible light to produce magnified images, especially of objects having dimensions smaller than the wavelengths of visible light, with linear magnification approaching or exceeding a million (106).

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Method for producing magnified images of a specimen by scanning its surface with an electron beam and capturing the scattered electrons

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Technique that produces magnified images of a specimen by scanning its surface with an electron beam

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An electron microscope in which a beam of focused electrons moves across the object with the secondary electrons produced by the object and the electrons scattered by the object being collected to form a three-dimensional image on a display screen

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This is a method for determining the surface structure of a solid by measuring the angle and energies of electrons scattered by the atoms on the surface of a sample.

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Scanning electron microscope

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Utilized in medical science and biology and in such diverse fields as materials development, metallic materials, ceramics, and semiconductors. SEM involves the manipulation of an electron beam that is scanned across the surface of specially prepared specimens to obtain a greatly enlarged, high-resolution image of the specimen's exposed structure. Specimens are scanned with a very fine probe ('tip') and the strength of interaction between the tip and surface us monitored. The specimen can be observed whole for assessing external structure or freeze-fracture techniques can be used to image internal structures

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A focussed electron beam is scanning the area under investigation. The electrons interact with the surface atoms resulting in backscattered electrons, secondary electrons, auger electrons and x-rays. Topographical information is predominantly provided by the secondary electrons, whereas chemical information can be concluded from the auger electrons and x-rays. To prevent local charging effects a conductive sample is required. In the case of isolating samples a thin layer of gold or carbon is evaporated initially.

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See virtual scanning electron microscopy [fl st u]

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Utilized in medical science and biology and in such diverse fields as materials development, metallic materials, ceramics, and semiconductors. SEM involves the manipulation of an electron beam that is scanned across the surface of specially prepared specimens to obtain a greatly enlarged, high-resolution image of the specimen's exposed structure. Specimens are scanned with a very fine probe ('tip') and the strength of interaction between the tip and surface us monitored. The specimen can be observed whole for assessing external structure or freeze-fracture techniques can be used to image internal structures

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Scanning electron microscope

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See Virtual Scanning Electron Microscopy [Fl St U]

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A method of producing images of a surface by scanning an electron beam over the sample and measuring the electronic interactions with the interface.

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