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Transmission
electron microscopy (TEM) is a microscopy technique
whereby a beam of electrons
is transmitted through an ultra thin specimen, interacting with the specimen
as they pass through. An image is formed from the interaction of the electrons transmitted through the specimen, which
is magnified and focused by an objective lens and onto an imaging device,
such as a fluorescent screen, as is common in most tems, on a layer of
photographic film, or to be detected by a sensor such as a CCD camera. The first
TEM was built by Max Knoll and Ernst Ruska in 1931, with this group developing the first TEM with resolving power greater than that of light in 1933 and the first
commercial TEM in 1939.
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