High-Resolution Transmission Electron Microscopy

 

HRTEM can provide structural information at better than 0.2 nm spatial resolutionl. In most crystalline inorganic materials, including ceramics, semiconductors and metals, the positions of individual atomic columns can be resolved, at least in low-index zones. When recorded under optimum conditions, electron micrographs can be directly interpreted in terms of the projected crystal potential. In other cases, image simulations are necessary to match proposed structures to image features.

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High resolution transmission electron microscopy

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High resolution transmission electron microscopy

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