can provide structural information at better than 0.2 nm spatial resolutionl.
In most crystalline inorganic materials, including ceramics, semiconductors and metals, the positions of
individual atomic columns can be resolved, at least in low-index zones. When
recorded under optimum conditions, electron
micrographs can be directly interpreted in terms of the projected crystal potential. In other cases, image simulations
are necessary to match proposed structures to image features.