A probe that measures the difference in work function between itself and the sample, with the use of an electrostatic force nulling technique in a two-plate capacitor configuration.
Source
�
___________________
Refer to this page:
Kelvin probe force microscope
Related Terms:
Note: If a company/institute/site doesn't want to present its own information in nanodic.com, it can sent one e-mail to info@nanodic.com.