magnetic force microscope (MFM) is a scanning probe microscope (SPM) that can
map the spatial distribution of magnetism
by measuring the magnetic interaction between a sample and a tip. As magnetic
devices have become smaller and smaller, an evaluation technique with nanoscale spatial resolution has become necessary. To meet this
need, the MFM was developed.
operation mode of an AFM, where magnetic interactions are detected. A magnetised probe is scanned at a certain height tracking
the topography, which was recorded in a first step. Thus a topographical
influence can be excluded.