Near Field Scanning Optical Microscopy

 

Near Field Scanning Optical Microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very close (<< ?) To the specimen surface. This allows for the surface inspection with high spatial, spectral and temporal resolving power. With this technique, the resolution of the image is limited by the size of the detector aperture and not by the wavelength of the illuminating light. As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as refractive index, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique.

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Technique for imaging surfaces in transmission or reflection by mechanically scanning an optical probe much smaller than the wavelength of light over the surface whilst monitoring the transmitted or reflected light

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Method for imaging surfaces in transmission or reflection by mechanically scanning an optical probe much smaller than the wavelength of light over the surface whilst monitoring the transmitted or reflected light

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