Particle-Induced X-ray Emission

 

Particle-Induced X-ray Emission or Proton Induced X-ray Emission (PIXE) is a technique used in the determining of the elemental make-up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element. PIXE is a powerful yet non-destructive elemental analysis technique now used routinely by geologists, archaeologists, art conservators and others to help answer questions of provenance, dating and authenticity.

Source

 

 

 

 

 

 


___________________

Refer to this page:

___________________

Related Terms:

 

Note: If a company/institute/site doesn't want to present its own information in nanodic.com, it can sent one e-mail to info@nanodic.com.