Photothermal
Micro-Spectroscopy (PTMS), alternatively known as PTTF (photothermal Temperature Fluctuation), [1] [2] is derived
from two parent instrumental techniques: infrared spectroscopy and atomic force microscopy (AFM). In
one particular type of AFM, known as scanning thermal microscopy
(see Scanning probe microscopy#sthm)
[1] , the imaging probe is a sub-miniature temperature
sensor, which may be a thermocouple or a resistance thermometer. This same
type of detector is employed in a PTMS instrument, enabling it to provide
AFM/sthm images: however, the chief additional use of PTMS is to yield
infrared spectra from sample regions as small as a micrometre or less, as
outlined below.
Source
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