The minimum distance between two features that can be distinguished in microscopy or fabricated with lithography.
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Refer to this page:
Atomic Force Microscopy
Scanning Tunnelling Microscopy
Ion Beam Analysis
Liquid Crystal Display
Scanning Electron Microscopy
Scanning Near Field Optical Microscopy
Transmission Electron Microscopy
High-Resolution Transmission Electron Microscopy
Immersion lithography
Nanoindentation
Nano-Optics
Near Field Scanning Optical Microscopy
Scanning Force Microscopy
Confocal Laser Scanning Microscopy
Confocal Scanning Microscopy
Electron Microscopy
Electron-beam-induced deposition
Light Emitting Diode
Magnetic Force Microscopy
Massometer
Nano Cubic Technology
Nanocrystal
Nanoimprint Lithography
NanoInk
Nano-test-tubes
Organic Light Emitting Diode
Scanning Electrochemical Microscopy
Scanning Hall probe Microscopy
Scanning Probe Microscopy
Scanning Thermal Microscopy
X-Ray Lithography
X-Ray Photoelectron Spectroscopy
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