Scanning Capacitance Microscopy

 

Scanning capacitance microscopy (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is held just above the surface of a sample and scanned across the sample. SCM characterizes the surface of the sample using information obtained from the change in electrostatic capacitance between the surface and the probe.

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Distinct operation mode of an AFM, where local differences in the surface capacity are recorded. The probe is scanning at a certain height with a modulated voltage applied simultaneously.

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A method for mapping the local capacitance of a surface. [NTN]

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A method for mapping the local capacitance of a surface. [NTN]

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A variation of scanning force microscopy that maps the localized capacitance of a surface.

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