Scanning Force Microscopy

 

A method to measure the interaction forces between two surfaces for getting a three-dimensional picture of the surface.

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Scanning force microscope

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A SFM works by detecting the vertical position of a probe while horizontally scanning the probe or the sample relative to the other. The probe is in physical contact with the sample and its vertical position is detected by detecting the position of a reflected laser beam with a photo diode that consists of two or four segments.

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Synonym for AFM

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An instrument able to image surfaces to molecular accuracy by mechanically probing their surface contours. A kind of proximal probe. .... A device in which the deflection of a sharp stylus mounted on a soft spring is monitored as the stylus is moved across a surface. If the deflection is kept constant by moving the surface up and down by measured increments, the result (under favorable conditions) is an atomic-resolution topographic map of the surface. Also termed an atomic force microscope. [FS]

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Scanning force microscope

Source

A SFM works by detecting the vertical position of a probe while horizontally scanning the probe or the sample relative to the other. The probe is in physical contact with the sample and its vertical position is detected by detecting the position of a reflected laser beam with a photo diode that consists of two or four segments.

Source

An instrument able to image surfaces to molecular accuracy by mechanically probing their surface contours. A kind of proximal probe. .... A device in which the deflection of a sharp stylus mounted on a soft spring is monitored as the stylus is moved across a surface. If the deflection is kept constant by moving the surface up and down by measured increments, the result (under favorable conditions) is an atomic-resolution topographic map of the surface. Also termed an atomic force microscope. [FS]

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A type of scanning probe microscopy that maps the topography of an interface by scanning a force sensor over the interface.

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Refer to this page:

Scanning Capacitance Microscopy

Scanning Probe Microscopy

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Related Terms:

 

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