Scanning Hall probe Microscopy

 

The scanning Hall probe microscope (SHPM) is a class of scanning probe microscope which incorporates the accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows a map of the magnetic induction associated with a sample to be created. Current state of the art SHPM systems utilise 2D electron gas materials (e.g. Gaas/algaas) to provide high spatial resolution (>300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).

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