Total Reflection X-Ray Fluorescence Spectroscopy

 

Method in which an X-ray spectrometer is used to measure the energy distribution of fluorescence X-rays emitted from a surface irradiated by primary X-rays under the condition of total reflection

Source

Method in which an x-ray spectrometer is used to measure the energy distribution of fluorescence x-rays emitted from a surface irradiated by primary x-rays under the condition of total reflection

Source


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