Method
for measuring the size and strain
of individual crystals
under about 0.1 nm, where the Debye rings (x-ray lines) generated by the
procedure are broadened NOTE Strain
in the material may also cause x-ray line broadening.
Technique
for measuring the size and strain
of individual crystals
under about 0.1 ?M, where the Debye rings (X-ray lines) generated by the procedure
are broadened
