X-Ray Diffraction Line Broadening

 

Method for measuring the size and strain of individual crystals under about 0.1 nm, where the Debye rings (x-ray lines) generated by the procedure are broadened NOTE Strain in the material may also cause x-ray line broadening.

Source

Technique for measuring the size and strain of individual crystals under about 0.1 ?M, where the Debye rings (X-ray lines) generated by the procedure are broadened

Source

 

 

 


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